Monomers & PlasticizersInhibitor RemoverMonomersPlasticizer Sample KitPlasticizers
PolymersIon Exchange ResinPolymer Sample KitsPolymersStandards
New Characterization Techniques for Thin Polymer FilmsCatalog #: 12-229
H. Tong, L.T. Nguyen (1990) 368 pp.
Various industries and universities have aimed their activities toward the development of highly sensitive techniques capable of studying ultrathin Polymers films. Provides researchers with a working description of the principles of operation, areas of application and data analysis methods for some of the newly developed techniques, as well as sufficient references for future in-depth studies of thin Polymers films. The techniques covered are divided into two groups–bulk property measurements and surface/interface property measurements–with chapters covering microdielectrometry, stress measurements by x-ray diffraction, laser interferometry, ion beam analysis, photothermal analysis, and XPS/SIMS/AES, among other techniques. Abstracts for each of the chapters are conveniently located in the preface.